Sample preparation for X-ray and neutron techniques or microscopy

At RISE, there is both equipment and knowledge to prepare your samples in the best way possible for analysis with advanced microscopy and/or with X-ray and neutron techniques (for example at MAX IV and ESS) such as tomography, scattering techniques, diffraction, spectroscopy.

Sectioning of micrometer-thin sections in a cryostat and of nanometer-thin sections in an ultramicrotome

Proper sample preparation is a prerequisite for being able to visualize the most complex materials with the technology you want or have access to. Analyses at synchrotrons for X-ray and neutron scattering are resource-intensive and it is important to be well prepared before your visit the facility. Sample preparation is a basic requirement for obtaining good analysis results, especially with these advanced techniques that provide high resolution.

For studies at MAX IV or other large research facilities, the material to be studied often needs to be thin and even. At RISE we can help prepare material for analysis, for example by sectioning it to the desired thickness from millimeters down to tens or hundreds of nanometers. In addition to advanced sample preparation for analysis at synchrotrons for X-ray and neutron scattering, we also offer preparatory or supplementary microscopy analysis of the samples for analysis at the synchrotron.

We have cryosectioning equipment, a Leica CM3050 S cryostat, where the samples are frozen and thinly sectioned in micrometer thickness. These samples can also be analyzed in the light microscope (LM).

For thinner samples, nanometer thickness, the samples are embedded in plastic to be able to be sectioned thinly. Plastic embedding at low temperature, Leica EM AFS2, and sectioning in an ultramicrotome Powertome XL with a diamond knife. These samples can also be analyzed in a transmission electron microscope (TEM).