Göran Wetter

Forskare

Tel

Location

Mölndal

Failure analysis of electronics, Materials analysis, Optical Microscopy, Microfocus X-ray inspection, Scanning Electron Microscopy (SEM), Scanning Acoustic Microscopy (SAM)

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Expertise

Material & failure analysis electronics

The extreme pace of development within materials and technology brings with it a large risk of mistakes and problems during electronics manufacturing. Failures that are not discovered in time can become very expensive. It is there…