SEM - Specialized in Identification and Control of Processes

Purpose

RISE specializes in identifying and controlling adhesions, stains, and deposits. You can rely on us to provide a precise and detailed analysis of your samples. We have extensive expertise and experience in this field and can handle a variety of sample types. Among the materials we routinely analyze are pulp, paper, and cardboard, but we also accept samples such as scrapings, spots, rubber sheets, printed end products, solutions, encrustations, and metals.

Our analysis scope extends across various areas, and we can perform different types of tasks to meet your specific needs. This may include surface studies to examine surface morphology and structure, crystal structure investigations to assess the material's crystalline properties, as well as cross-sectional analyses to gain insights into the material's internal structure. We are also proficient in analyzing filler distribution in cross-sections and conducting filler characterization, which can be crucial for the material's properties and performance.

Our services also encompass common analyses such as pigment coverage and elemental composition analysis. We can provide you with a detailed assessment of pigment coverage properties and a thorough analysis of the elemental composition in your material. Additionally, we conduct inspections of creases and coating layers to evaluate both the quantity and composition of these material layers.

Methods, Instruments and Competences

Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy (SEM/EDX) is an exceptional instrument widely used in the research and development of materials and processes across various industries. This powerful analytical tool offers unique capabilities that contribute significantly to advancing scientific knowledge and technological innovation.

SEM allows for high-resolution imaging of surfaces with magnifications ranging from tens to hundreds of thousands of times, providing detailed information about the morphology, topography, and microstructure of materials. It enables researchers to visualize surface features, such as grains, pores, cracks, and coatings, with exceptional clarity and precision. This capability is invaluable for studying the structure-property relationships of materials, understanding surface phenomena, and optimizing process parameters.

In addition to imaging, SEM is often combined with Energy Dispersive X-ray Spectroscopy (EDX), which enables elemental analysis of the sample. EDX detects characteristic X-rays emitted from the sample when bombarded with an electron beam in the SEM. By analyzing the energy and intensity of these X-rays, EDX can identify the elements present in the sample and determine their relative concentrations. This elemental analysis provides valuable insights into the chemical composition, distribution of elements, and impurities within the material.

The integration of SEM and EDX offers several advantages in material and process research and development:

1. Elemental Analysis: EDX allows researchers to identify and quantify the elemental composition of materials, which is crucial for understanding their properties, performance, and behavior in various environments.
2. Microstructural Characterization: SEM provides detailed imaging of microstructures, while EDX offers chemical information at specific locations within the microstructure. This combination facilitates comprehensive microstructural analysis, including phase identification, grain boundary analysis, and defect characterization.
3. Surface Morphology Studies: SEM enables the examination of surface features and textures, while EDX can detect surface contaminants, coatings, and elemental distributions. This capability is essential for investigating surface modification techniques, adhesion mechanisms, and surface functionalization processes.
4. Failure Analysis: SEM/EDX is widely used for investigating the root causes of material failures, such as fractures, corrosion, and wear. The combination of high-resolution imaging and elemental analysis helps identify failure mechanisms, assess material integrity, and develop strategies for improving product reliability and durability.
5. Process Optimization: SEM/EDX can be employed to evaluate the effects of process parameters, treatments, and manufacturing techniques on material properties and performance. By correlating microstructural features with composition data, researchers can optimize process conditions, enhance product quality, and minimize defects.

Competence:

RISE possesses high expertise in Scanning Electron Microscopy (SEM) with extensive experience in handling industrial samples. These professionals are adept at preparing samples, optimizing imaging parameters, and interpreting SEM images to extract meaningful information about the structure and composition of materials.

RISE's expertise in SEM extends to the analysis of industrial samples, including metals, polymers, ceramics, composites, and more. Whether it's investigating material defects, characterizing surface features, or studying microstructural changes due to processing or environmental factors, RISE has the capabilities to address a wide range of industrial challenges using SEM.

Delivery

RISE offers a report that includes data in Excel format and relevant images and diagrams. It is meticulously compiled using standard methods for the performed analyses. The report also includes an assessment of measurement uncertainty to ensure the reliability of the presented results. All relevant parameters relevant to the specific analysis are included to provide a comprehensive picture of the situation. Additionally, detailed comments and explanations are included to provide further insight and understanding of the presented data.

RISE strives to ensure the highest possible quality and reliability in the presented results, which in turn helps customers and stakeholders make well-informed decisions based on the provided information.

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