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SAXS/WAXS/GISAXS measurements on nanostructured materials

Are you curious about the nanostructure of your material? We offer characterization on nanoscale level of materials by SAXS, WAXS and GISAXS measurements at our laboratory beamline. Depending on the material type, the material characterization involves analysis of size, shape, periodicity, porosity, orientation, crystalline structure, etc.


Characterization of the nanostructure of materials provides an opportunity to understand the relationship between process, structure and material properties.

  • Do you know the relationship between nanostructure and macroscopic e g mechanical properties of your material?
  • Will your process parameters affect the nanostructure of your material?
  • Are you planning to do advanced X-ray scattering studies on a synchrotron facility? SAXSpoint 2.0 provides analysis results of materials nanostructures close to the synchrotron level.


SAXS* measurements provide information on structures in the range 1 - 170 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. SAXSpoint 2.0 is a unique, advanced, automated SAXS / WAXS* / GISAXS* instrument from Anton Paar. In order to minimize background disturbance, the sample chamber is under vacuum, which means that the sample environment must be vacuum compatible. Glass capillaries are used for liquids, and wet samples can be mounted in sample holders with windows of Kapton film. SAXS and WAXS measurements are made on the same sample with scattering angles up to 65 °. A background measurement of air / water between the Kapton films is normally made with the same settings. The background measurement is subtracted from the sample measurements.

GISAXS is a scattering technique used to study nanostructured surfaces and thin films. The sample is mounted on a GISAXS sample holder.

SAXSpoint 2.0 instrument data:

• X-ray source: Microsource Supernova Copper, wavelength 1.541 Å

• X-ray optics and collimation: ASTIX optics and X-ray alignment

• sample holders for liquids, solids, powders and thin films

• test environment: vacuum; ambient or temperature controlled

• detector: 2 D Eiger R 1M

• Available q range: 0.037 nm-¹ to 43.9 nm-¹, 170 nm> d> 0.14 nm

• software: SAXSdrive ™ for measurement and SAXSanalysis ™ for analysis

* Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS) and Grazing-Incidence Small Angle X-ray Scattering (GISAXS)


Measurement data and report with analysis results.


For more information and price contact Anita Teleman Jasna Stevanic Srndovic Tomas Larsson



SAXS/WAXS/GISAXS measurements on nanostructured materials

Innovation area

Bioeconomy, Formulated products, Packaging, Chemical processes and products, Food, Pharmaceuticals, Pulp and paper, Material transition, Production and manufacturing, Testing, Textile, Wood technology, Surface technology


  Contact us for price information.

Delivery time

Delivery time depends on the scope of the analysis.


Contact us for discussion of amount of material etc. Possibility to participate at the measurement occasion.

Anita Teleman

Contact person

Anita Teleman

Principal Scientist

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Tomas Larsson

Contact person

Tomas Larsson

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* Mandatory By submitting the form, RISE will process your personal data.