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SAXS/WAXS/GISAXS measurements on nanostructured materials
Are you curious about the nanostructure of your material? We offer characterization on nanoscale level of materials by SAXS, WAXS and GISAXS measurements at our laboratory beamline. Depending on the material type, the material characterization involves analysis of size, shape, periodicity, porosity, orientation, crystalline structure, etc.
Purpose
Characterization of the nanostructure of materials provides an opportunity to understand the relationship between process, structure and material properties.
- Do you know the relationship between nanostructure and macroscopic e g mechanical properties of your material?
- Will your process parameters affect the nanostructure of your material?
- Are you planning to do advanced X-ray scattering studies on a synchrotron facility? SAXSpoint 2.0 provides analysis results of materials nanostructures close to the synchrotron level.
Method
SAXS* measurements provide information on structures in the range 1 - 170 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. SAXSpoint 2.0 is a unique, advanced, automated SAXS / WAXS* / GISAXS* instrument from Anton Paar. In order to minimize background disturbance, the sample chamber is under vacuum, which means that the sample environment must be vacuum compatible. Glass capillaries are used for liquids, and wet samples can be mounted in sample holders with windows of Kapton film. SAXS and WAXS measurements are made on the same sample with scattering angles up to 65 °. A background measurement of air / water between the Kapton films is normally made with the same settings. The background measurement is subtracted from the sample measurements.
GISAXS is a scattering technique used to study nanostructured surfaces and thin films. The sample is mounted on a GISAXS sample holder.
SAXSpoint 2.0 instrument data:
• X-ray source: Microsource Supernova Copper, wavelength 1.541 Å
• X-ray optics and collimation: ASTIX optics and X-ray alignment
• sample holders for liquids, solids, powders and thin films
• test environment: vacuum; ambient or temperature controlled
• detector: 2 D Eiger R 1M
• Available q range: 0.037 nm-¹ to 43.9 nm-¹, 170 nm> d> 0.14 nm
• software: SAXSdrive ™ for measurement and SAXSanalysis ™ for analysis
* Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS) and Grazing-Incidence Small Angle X-ray Scattering (GISAXS)
Deliveries
Measurement data and report with analysis results.
